Semiconductor device testing
This type of equipment is used for reliability testing such as characteristic analysis of components, high and low temperature temperature variation testing, temperature shock testing, failure analysis, etc. It solves the local testing requirements that traditional high and low temperature boxes cannot meet. The equipment is easy to move and suitable for high and low temperature testing of a single component of multiple components or components with flat surfaces and flat structures.
 
		 
  
 




 
			 
			 
			 
			 
			 
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Free installation/debugging 
				 
			 
			 
			 
			 
		 
			